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X-ray Diffraction


Powder diffractometry is an analytical method to investigate the structure of bulk polycrystalline materials both in-situ and ex-situ (lattice constants, phase composition, grain size and residual stresses).

A typical application would be the investigation of structural changes in silicon carbide ceramics as a result of thermal treatment.

With X-ray single crystal diffractometry the structure of complex, crystallized molecules (lattice parameters up to 100 Å at ANKA) can be revealed. It yields the atomic coordinates within the unit cell of a single crystal.

This method is often used at ANKA for the structure determination of small or weakly diffracting crystals.

In addition, diffraction studies on surfaces and interfaces, such as semiconductor interfaces, are feasible.